Abstract
Lately considerable research activity has been centered on the development of optical and solid state components and devices which use inhomogeneous materials with a continuous variation of the electromagnetic parameters. In this contribution we consider the analysis of monolithic microwave integrated circuits (MMICs) with substrates whose relative permittivity continuously varies along the stratification axis. We propose a new, very efficient combined spectral domain-moment method formulation based on the derivation in a closed analytical form of the spectral electric dyadic Green's function. We, finally, present an application of the new technique to the design of practical, high efficient MMIC components.
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