Abstract

The interaction between cellulose and hemicelluloses is of fundamental importance for understanding the molecular architecture of plant cell walls. Adsorption of xyloglucan (XG) onto regenerated cellulose (RC), sulfated cellulose nanocrystal (s-CNC), and desulfated cellulose nanocrystal (d-CNC) films was studied by quartz crystal microbalance with dissipation monitoring, surface plasmon resonance, and atomic force microscopy. The amount of XG adsorbed onto different cellulose substrates increased in the order RC < s-CNC < d-CNC. The adsorption of XG onto RC films was independent of film thickness (d), whereas XG adsorption was weakly dependent on d for s-CNC films and strongly dependent on d for d-CNC films. However, approximately the same amount of XG adsorbed onto “monolayer-thin” films of RC, s-CNC, and d-CNC. These results suggest that the morphology and surface charge of the cellulose substrate played a limited role in XG adsorption and highlight the importance of film thickness of cellulose nanocrystalline films to XG adsorption.

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