Abstract

Epitaxial La-doped BaSnO3 films were grown in an adsorption-controlled regime by molecular-beam epitaxy, where the excess volatile SnOx desorbs from the film surface. A film grown on a (001) DyScO3 substrate exhibited a mobility of 183 cm2 V−1 s−1 at room temperature and 400 cm2 V−1 s−1 at 10 K despite the high concentration (1.2 × 1011 cm−2) of threading dislocations present. In comparison to other reports, we observe a much lower concentration of (BaO)2 Ruddlesden-Popper crystallographic shear faults. This suggests that in addition to threading dislocations, other defects—possibly (BaO)2 crystallographic shear defects or point defects—significantly reduce the electron mobility.

Highlights

  • Transparent conducting oxides with high mobility are being studied in hopes of realizing highperformance transparent electronics.[1]

  • La-doped BaSnO3 has emerged as a material of interest in this arena due to its high mobility at room temperature, transparency, and stability

  • La-doped BaSnO3 single crystals are reported to have mobilities as high as 320 cm[2] V 1 s 1 at room temperature at a mobile electron concentration of n = 8 × 1019 cm 3.2 La-doped BaSnO3 has a higher mobility than all mainstream semiconductors (Si, GaAs, GaN, etc.) at doping concentrations above about n = 1019 cm 3, where it is degenerately doped;[3] CdO is the only transparent semiconductor with higher mobility in this doping range.[4]

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Summary

Introduction

Transparent conducting oxides with high mobility are being studied in hopes of realizing highperformance transparent electronics.[1]. (Received 27 August 2017; accepted October 2017; published online November 2017)

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