Abstract
Amorphous Cu66Zr34 alloy decomposes into Cu, ZrO2, and residual amorphous phase after oxidation, mainly due to differences between the oxygen affinity to Cu and Zr. A four-layer structure formed near the surface consisting of two oxidized layers, a transition region, and the matrix. The crystalline phases exhibited a gradient distribution along the thickness. The oxidized ribbons showed an adjustable temperature coefficient of electrical resistivity as a function of thickness. Near constant electrical resistivity (TCR≈0) could be obtained with a thickness of 20μm. Such transformation can be utilized for producing precision wires or thin-film chip resistors through oxidation.
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