Abstract
The visibility of details in specimens observed by transmission electron microscopy can be improved by using slot shaped objective apertures, the high resolution being retained in only one chosen direction. The special objective apertures and controller developed for this purpose are described. Slot apertures of adjustable width (down to 2 mu m) and orientation are obtained by orthogonally superposing inside the microscope two rectangular apertures mounted on two circular an concentric platforms. The platforms are pulley shaped and can be independently rotated, while in contact, by means of counter sprung wires attached to two micrometers. The use of this device does not interfere with the normal operation of the microscope.
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