Abstract
When the distance between internal defects is short during ultrasonic flaw detection, each reflected wave may be observed as a composite wave in the observed waveform. In this paper, we confirmed that it is possible to separate the reflected waves from each defect by using sparse modeling for such synthetic waves. It was also found that the resolution can be improved by comparing the resolution with deconvolution, which is one of the existing signal processing methods.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEJ Transactions on Electronics, Information and Systems
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
