Abstract
We show that silicon microrings with adiabatically widened bends are more tolerant to dimensional variations than conventional microring designs with uniform waveguide widths. Through wafer-scale measurements of test structures fabricated in the IMEC Standard Passives process (193 nm DUV lithography, 200 mm SOI wafer), improvements in the intra-die and wafer-scale variation of the resonance wavelength are demonstrated. A 2.1× reduction in the standard deviation of the resonance wavelength across the wafer was observed.
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