Abstract
Polycrystalline diamond films were deposited on (100) oriented silicon substrates using a microwave plasma disk reactor. Circular delaminations between the diamond thin film and the silicon substrate were produced by Vickers microindentation. While an overall relationship between mean delamination diameter and film thickness was not observed, an unexpectedly strong correlation was observed between delamination diameter and the square root of the coating grain size. A disadvantage of the Vickers microindentation technique is the damage sustained by the Vickers indenter tip after repeated loadings.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
