Abstract
Abstract In the last 25 years, surface sensitive analytical techniques have made a major contribution to our understanding of adhesion phenomena and problems. There are several areas where these techniques have provided important information including the identification of failure modes, the chemistry of a substrate before and after pretreatments, the stability of surfaces and interfaces, the identification of surface contaminants, the interaction across an interface and the nature of interphases. X-ray photoelectron spectroscopy (XPS or ESCA), Auger electron spectroscopy (AES) and static secondary ion mass spectrometry (SSIMS) have proved to be especially useful. Many examples of the usefulness of these techniques are given.
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