Abstract
Analog-to-digital converter (ADC) characterization is usually performed using stationary stimuli like sine waves. However, the use of a non-stationary stimulus, besides providing testing conditions closer to those found in real applications, can lead to interesting improvements in ADC testing speed. This kind of signal needs proper processing techniques in order to extract useful information. In this paper we propose the use of joint time–frequency analysis (JTFA) for this purpose. The basic principles of the technique, and how it can be used in ADC testing are presented. In particular, a method for characterising an ADC on its entire bandwidth using a single stimulus is described.
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