Abstract
A variable wavelength interferometric (VAWI) method was previously proposed for testing birefringent retarders using a double-refracting interferometer. If the spectral dispersion of double refraction of the interferometer is identical with, or similar to, that of the birefringence of the retarder under study, then the VAWI method takes a specific form, referred to as object-adapted (or adaptive) variable wavelength interferometry (AVAWI), which enables the phase retardation (δ) and/or the thickness ( t) of the birefringent retarders to be measured very precisely by using relatively simple means. This new approach is quite simple in its mode of operation and gives results (δ and/or t) with the relative error as low as 0.01%.
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