Abstract
Distributed self-diagnosis approach proposed for multiprocessor systems is also effective for integrated circuit wafers containing a number of identical circuits. Here the testing of each node is based on the majority voting on the test results from itself and neighboring nodes. In this paper, we identify that the unanimous voting (UV) approach always outperforms the individual voting (IV) approach, irrespective of the number of voting cells and fault rate. Based on the UV approach, the optimal number of tests is obtained. We also introduce an adaptive voting scheme by which the test overhead of the traditional voting schemes can be significantly reduced. >
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