Abstract
The resolution of current cryoelectron microscopy of radiation-sensitive specimens is ultimately limited by statistical noise because of the necessarily small number of electrons. To bypass this resolution barrier, we propose an extended in-focus phase-contrast microscopy scheme. The scheme incorporates a pixelwise deformable electrostatic mirror at a plane conjugate to the back focal plane of the objective lens. This setup would extract structural information more efficiently than otherwise and naturally enable generation of phase contrast. We present key concepts regarding microscope operations and estimate the degree of electron dose reduction that should in turn enable a resolution improvement.
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