Abstract
This review describes the principles and capabilities of X-ray adaptive and active optics. The main executive mechanisms of bending mirrors used at synchrotron radiation sources and in X-ray telescopes are considered. Particular attention is paid to wavefront metrology using Shack-Hartmann sensors, as well as sensors based on grating interferometers, X-ray speckle and ptychography. Keywords: X-rays, adaptive optics, active optics, bimorph mirror, wavefront metrology.
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