Abstract

Adaptive test is a promising approach for test cost reduction. This article presents an adaptive test scheme for analog circuits that capitalizes on alternate test to achieve a low cost for the majority of fabricated devices. The small fraction of devices for which the alternate test decision may be prone to error are identified and further action is taken.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call