Abstract
We have adapted a commercial CMOS optical image sensor for use as a fast x‐ray detector. The sensor was used in a mode where the x‐rays impinge directly on the sensor. Area detectors can significantly improve the signal‐to‐noise ratio of acquired data in the low photon count rate situations (even at 3rd generation synchrotron sources) encountered in both small angle x‐ray scattering (SAXS) and x‐ray photon correlation spectroscopy (XPCS) experiments,. CCD area detectors have been used for these types of experiments, but the relatively slow readout times typical of CCDs limit their use for studying the dynamics and kinetics of many samples. We characterized the performance of a CMOS optical detector for use in XPCS experiments.
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