Abstract
The concept of X-ray active matrix pixel sensor (XAMPS) is introduced. XAMPSs are direct illumination, position sensitive X-ray detectors with the possibility of containing 1000 000 pixels. They count the number of diffracted X-rays in each pixel by measuring the total charge released by converted X-rays in the body of the sensor. Readout is accomplished with a relatively small number of channels equal to the square root of the number of pixels. The estimated readout time can be about 1 ms. Noise of the readout electronics can be so low that practically no additional fluctuations in the number of incident X-rays per pixel are added and, therefore, the XAMPS performance is very close to that of an ideal detector for X-ray crystallography.
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