Active control of dielectrophoretic force at nanowire electrode for ultrahigh single nanoparticle manipulation yield

Abstract

We introduce ultrahigh-yield single nanoparticle control based on active control of the dielectrophoretic (DEP) force (ACDF). Attachment and detachment are accomplished reversibly using a combination of negative and positive DEP forces. A silicon-oxide (SiO2)-surrounded gold nanowire electrode was designed for ACDF. Nanoparticle motions were analyzed to confirm inducement of the negative DEP force, which is the most important for realizing ACDF. Polystyrene nanobeads and quantum dots were used. Ultrahigh-yield single nanoparticle manipulation was achieved at every designed position using ACDF.