Activation of Mg-doped P-GaN by using two-step annealing

Abstract

One- and two-step rapid thermal annealing (RTA) for activating Mg-doped p-type GaN films had been performed to compare with conventional furnace annealing (CFA). The two-step annealing process consists of two annealing steps: the first step is performed at 750°C for 1min and the second step is performed at 600°C for 5min in pure O2 or air ambient. It is found that the samples annealed in air ambient exhibit poor electrical properties as compared to those annealed in pure O2. Compared to one-step RTA annealing and CFA annealing, the samples with two-step annealing exhibit higher hole concentration and lower resistivity. This means that the two-step annealing is a powerful method to enhance the electrical performance of Mg-doped p-type GaN films. Similar results were also evidenced by photoluminescence (PL) measurement. Possible mechanism was confirmed by secondary ion mass spectrometry analysis.