Abstract

Abstract : We have acquired a custom-designed Nanonics Multiview 400 Combined microRaman, Scanning Probe Microscope (SPM), and Nanoindenter system. Such combined system integration permits correlation of SPM topography of a sample surface with microRaman spectra. The Nanonics SPM/NSOM component generates surface morphology images while Raman components can measure electrical properties and chemical signatures. The presence of the Nanoindenter allows simultaneous detection of Raman peaks under stress. The broad goal is to permit characterization of local mechanical, chemical and electrical properties in-situ and simultaneously in active polymers and nanocomposites. The proposed equipment will greatly impact an ongoing AFOSR project on active nanocomposites, as well as ongoing and proposed DoD and NSF projects lead by the Pis. The capabilities of the custom-designed Nanonics expand to nanoscale mechanical, electrical, and chemical properties of metallic and ceramic thin films and coatings, and MEMS and NEMS devices, extending its impact to a variety of ongoing and future collaborations and research projects. The combination of micron-scale and nano-scale techniques in the proposed equipment makes it uniquely capable of bridging the gap between interfacial interactions and macroscale properties in advanced materials in general and nanostructured materials in particular. The surface morphological information, internal stress, and electrical properties of such materials have been studied separately and the structure-property is yet to be related intrinsically. Having such a system will enable us to investigate the interfacial forces between components and understand the effects of molecular structure and inclusion distribution on nanocomposites. The simultaneous capabilities of the custom-designed equipment are unique and will complement and expand our research and current materials characterization infrastructure, specifically in the area of multifunctional materials.

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