Achieving Energy Efficiency for Near-Threshold Circuits Through Postfabrication Calibration and Adaptation

Abstract

Scaling supply voltage to the near-threshold voltage (NTV) region is an effective approach for energy-constrained circuit design at the cost of acceptable performance reduction. However, by operating in the NTV region, the sensitivity of circuits to process and runtime variations significantly aggravates. Therefore, the performance and power consumption of a circuit is largely impacted by the variabilities, which affects the operating voltage for the most efficient computation, i.e., the minimum energy point (MEP). Accordingly, finding an optimum operating voltage for near-threshold computing (NTC) to account for variabilities is very challenging. In this article, we propose an MEP calibration and adaptation approach based on machine learning to tune for minimal energy operation on a per-chip basis by considering process and runtime variations. In the proposed approach, the optimal supply voltage of each chip is determined during manufacturing tests by characterizing dynamic and leakage power and at runtime by considering the impact of temperature variation. The presented method does not require costly power measurement circuitry on chip. The simulation results show that the proposed method has high MEP prediction accuracy and achieves near-optimal operation by only 1.2% higher energy consumption compared with the optimal operation.