Abstract
Recent achievements of NEDO projects on SOFC durability are summarized with focuses on cathode degradations and ohmic loss increases. The main reason for large cathode degradations was identified as contamination of sulfur in air in CRIEPI sites. This happens to clarify that cathodes in the IT-SOFCs are quite sensitive to sulfur depending on cell/stack designs in a sense that porosity of ceria interlayer affects cathode degradations and also that the thickness of YSZ electrolyte may influence. An attempt was made to propose a new model based on movements of cations and protons to explain such behaviors. The conductivity degradations have been found not so big to the total ohmic losses, suggesting needs of further examinations on other sources.
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