Abstract
ABSTRACTIn this paper, a super high-resolution algorithm is proposed to estimate the complex relative permittivity of a planar material placed in free-space based on the transmission coefficients measurement of the material sample. Operating at X-band, the complex relative permittivity of the material is estimated by the proposed algorithm without determining an integer time the wavelength in the under test sample. The proposed algorithm is verified for POM-C sample with different numbers of frequencies. The measurement results show that the dielectric constant of POM-C sample is determined accurately when the number of frequencies is more than or equal to 201.
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