Abstract
Techniques for accurate structure-factor determination with electron diffraction are discussed. Topics covered include: the systematic row method; three- and four-beam nonsystematic cases; zone-axis convergent-beam electron diffraction; the critical voltage and intersecting-Kikuchi-line method; phases and absorption in multiple-beam cases; and thickness fringes. Keywords: Bethe approximation; Bloch-wave method; convergent-beam electron diffraction; critical-voltage effect; Debye–Waller factors; dispersion surfaces; electron diffraction; extinction distance; Fourier potentials; Intersecting-Kikuchi-line method; Kikuchi patterns; Kossel patterns; Schrodinger wave equation; structure factors; Thickness fringes
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