Abstract
For advanced CMOS technology, series resistance is an important source of error in capacitance-voltage (C-V) measurement. Independent accurate determination of series resistance is generally not possible. Recently, we introduced a new C-V measurement method using time domain reflectometry (TDR). Here, we show that the TDR method also allows series resistance to be determined independently and accurately
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have