Abstract
Particle induced X-ray emission (PIXE) analysis is well established as a multi-element, non-destructive technique to measure the trace element content of thin samples (≤ 1 mg/cm2). The wide range of its analytical applications was shown in numerous reports at the 2nd International PIXE Conference in Lund. For thin sample analysis routinely done at the Marburg PIXE facility, we calibrated our spectrometer empirically at proton energies of 2 and 4 MeV using two separate sets of calibration standards, one purchased from MicroMatter Co., the other prepared by precipitate exchange. Both sets of standards were checked by AAS and CMP. K-shell ionization cross sections, calculated from our measured x-ray yields, agree very well with recent literature values, and will be reported elsewhere.
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