Abstract
The first resonant guided mode of P→P reflection in Half-leaky Guided Mode (HLGM) technique is very sensitive to the tilt angle of uniaxial liquid crystals. A formula is presented to describe the relationship between the tilt angle and the incident angle of the first resonant valley point of P→P reflectivity, R pp. This method is suitable to measure tilt angle of any degree, especially 3–85°, with high sensitivity. The great variations of LC layer thickness, LC near-surface sublayers, PI layers, or ITO layers have few effects on the position of the first resonant valley point of R pp. The method can be used to measure tilt angles with high sensitivity, without other influences, and exempt from the time consuming numerical fitting with a complex model, which is needed in other methods by Guided Modes.
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