Accurate method for determining tilt bias angles in thin films of nematic liquid crystals

Abstract

We have developed a new method for measuring tilt bias angles in spatially uniform and nonuniform thin films of nematic liquid crystals. The method employs modulation ellipsometry, based on the use of an exponentially decaying light wave to probe the boundary layer. Oscillations of the director of the liquid crystal, which are induced by the flexoelectric torque, are excited with an external periodic field. A periodic variation of the ellipticity of the light wave reflected from the interface is detected at both the first and second harmonics of the exciting electric field. When these two Fourier components of the electrooptic response are known, it is possible to calculate both the tilt bias angle θ0 of the director and the dynamic deviation δ0 of the tilt bias angle. The angles θ0 and δ0 measured by this method on the surface of an electrode (ITO) and on the surface of a ferroelectric film (a copolymer of vinylidene fluoride and trifluoroethylene), oriented in a corona discharge, were equal to θ 0=5.1°, δθ=0.5° and θ0=89°, δθ=0.06°, respectively.