Abstract
Advancements in trace clement analysis require improvements in both the signal-to-noise ratio and accurate background correction. With a sequential spectrometer, one can obtain detection limits of around 0.1 ppm for medium to heavy Z elements. Conditions can be individually optimized for each element, for example, selection of filters, collimators, crystals and background subtraction. The disadvantage is that the analysis time may become “long” if many elements are to be analyzed. This long exposure time can lead to the deterioration of some samples.
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