Abstract
Photonic crystal slab devices with subwavelength periods can be tailored to provide remarkable functionality, such as ultrahigh reflectivity in a structure only 200 nm in thickness. Accurate measurement of the characteristics of these structures is essential to compare their performance to theoretical expectations and to better understand the origin of unexpected behavior. In this work, we present a simple non-invasive method employing diffraction of a visible wavelength reference in the Littrow configuration for measuring the period of a photonic crystal slab. We have measured periods of our devices with uncertainty below 0.5 nm and expect that the uncertainty could easily be improved by an order of magnitude. In addition to facilitating development, our approach can be used to explore possible variations in the period of the photonic crystal due to its operating environment and aging.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
