Abstract
A new modulation interferometric technique for accurate measurement of electro-optic coefficients is presented. The accuracy is achieved by detecting the signal both at first and second harmonics of the modulation frequency, while the phase is electronically scanned along two interference orders. This eliminates the uncertainty encountered on measuring specified intensities and phase differences. The method has been applied to the precise measurement of the unclamped electro-optic coefficients at λ=632.8 nm of quasi-stoichiometric ( r 33=29.4±0.2 pm/V, r 13=9.25±0.07 pm/V) and congruent ( r 33=31.4±0.2 pm/V, r 13=10.49±0.07 pm/V) LiNbO 3.
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