Abstract
A sphere arrangement for directional-hemispherical reflectance measurements in the 1-15-microm wavelength range is tested for its accuracy. Comparative measurements with the fundamental PTB sphere reflectometer in the overlapping spectral range between 1.0 and 1.1 microm indicate no systematic measurement uncertainties of the new device. The uncertainty of the reflectance measured by it is therefrom deduced to be +/-0.01 for the 1-5.6-microm wavelength range.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
