Abstract
The paper investigates the residual uncertainties effects in on-wafer load pull test sets. After the systematic error correction, based on traditional error-box model, the residual uncertainties on absolute power levels measurements can dramatically affect the accuracy of typical non-linear parameters such as power added efficiency, intermodulation distortion and output power levels for different load conditions. The main causes of residual errors are highlighted, a detailed theoretical analysis is given and the uncertainties effects experimentally evaluated.
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