Accuracy characteristics for quantum process tomography using superconductor phase qubits

Abstract

We propose a method for precision statistical control of quantum processes based on superconductor phase qubits. Using the universal quantum tomography method, we provide a detailed analysis of accuracy of tomography for a 2-qubit gate SQiSW, which arises due to capacitive coupling between qubits. The developed approach could be successfully applied for quality and efficiency problems of superconductor quantum information technologies.