Abstract
The estimation of percentage defectives using a normal sampling plan will not be appropriate when the assumption of normality is violated. In this paper, we propose a sampling plan based on a more general symmetric family of distributions with the parameters estimated using the modified maximum likelihood (MML) procedures introduced by Tiku and Suresh . This sampling plan works well for most of the symmetric non-normal distributions. Some numerical study has also been carried out to show the superiority of the proposed plan.
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