Abstract
Several accelerator-based analysis techniques have proven useful in diagnosing plasma-edge and first-wall conditions in two tandem-mirror fusion experiments. This paper describes the various techniques and the use of solid-state probes in the tandem-mirror devices TMX and TMX-U in conjunction with subsequent analysis by Rutherford backscattering spectrometry (RBS), nuclear reaction analysis (NRA), and secondary ion mass spectrometry (SIMS). RBS was used to measure the concentration of deposited impurities on solid-state probe samples. NRA, utilizing the D( 3He, α )H reaction, gave quantitative data about deuterium retention levels in carbon samples exposed to the plasma. SIMS analysis produced near-surface depth profiles of implanted deuterium in exposed silicon samples. Taken together, these techniques provided detailed information about impurity levels, the flux and energy of particles striking the first-wall, and plasma-edge temperatures. This information has contributed towards an understanding of the confinement properties of tandem mirrors.
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