Abstract
In this article, a progressive-stress accelerated life test (ALT) that is based on progressive type-II censoring is studied. The cumulative exposure model is used when the lifetime of test units follows Pareto-IV distribution. Different estimates as the maximum likelihood estimates (MLEs) and Bayes estimates (BEs) for the model parameters are discussed. Bayesian estimates are derived while using the Tierney and Kadane (TK) approximation method and the importance sampling method. The asymptotic and bootstrap confidence intervals (CIs) of the parameters are constructed. A real data set is analyzed in order to clarify the methods proposed through this paper. Two types of the progressive-stress tests, the simple ramp-stress test and multiple ramp-stress test, are compared through the simulation study. Finally, some interesting conclusions are drawn.
Highlights
In most of the classical life testing and reliability experiments, collecting enough number of failure times is not easy, especially when the products are highly reliable with long lifetimes
This study addressed statistical inference that was based on progressively type-II censored data from Pareto-IV distribution under progressive-stress accelerated life test
The statistical inference that was covered in this paper includes: estimating the unknown parameters of Pareto-IV distribution by several methods, including the classical method and Bayesian methods
Summary
In most of the classical life testing and reliability experiments, collecting enough number of failure times is not easy, especially when the products are highly reliable with long lifetimes. The failure time data from ALTs are analyzed in order to estimate the life characteristics of the products under normal conditions. There are different ways in which the ALT can work, for example, constant, step, and progressive stress ALT Nelson discussed these different types [1]. The most popular censoring type is the progressive type-II censoring scheme (CS) It can be illustrated, as follows: suppose n identical units or devices are put on a life time test with m ≤ n is a pre-specified number of failures. The contribution in this paper is studying statistical inference of progressive-stress ALT for test units whose lifetime follow Pareto-IV distribution in the presence of progressively type-II censored data.
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