Abstract
The test principle, test type and test model of accelerated life test, as well as the data processing method of unilateral confidence estimation are introduced. Taking the enhanced field effect transistor as an example, a reasonable accelerated life test scheme is formulated by selecting the appropriate accelerated test model and stress conditions. After the test, the life characteristic value of the device under normal stress level is calculated according to Arrhenius equation and unilateral confidence estimation method. Through research, an accelerated life test method for processing non failure data is provided.
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