Abstract
We proposed an accelerated life testing method for the storage vacuum electronic devices (SVED) based on pressurization according to the relationship between gas inflow rate and pressure. And then a storage life assessment model was presented, using the cathode current to evaluate the SVED performance. Consequently, a test platform was established to verify the ALT method by storing three SVEDs in air for 10y and at 4.5 atm within its pressure limit for 5m. The results showed that, when pressurization, the cathode current dropped faster than when stored in air. And the expected storage life of the three SVEDs decreased from 10.4y, 15.5y and 31.4y respectively when stored in air to 2.6y, 3.9y and 10.0y respectively when stored at 4.5 atm. Also, leak plays a more important role than permeation in determining the storage life of the SVED.
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