Accelerated damp-heat testing at the cell-level of bifacial silicon HJT, PERC and TOPCon solar cells using sodium chloride

Abstract

Bifacial passivated emitter and rear cells (PERC) currently have the highest share in the photovoltaic market. However, heterojunction (HJT) and tunnel oxide passivated contact (TOPCon) solar cells are expected to gain significant market share shortly. Despite technological advancements, concerns about the reliability of HJT and TOPCon technologies when deployed in the field still need to be addressed. This work investigates the impact of sodium chloride (NaCl) on damp-heat-induced degradation in bifacial HJT, PERC, and TOPCon solar cells by exposing the solar cells to NaCl before damp heat (DH) testing. It is found that among all investigated cell technologies, TOPCon solar cells degrade the most with maximum power (Pmax) loss of up to ∼75%rel, followed by HJT (Pmax drops ∼50%rel), and PERC cells (Pmax drops only ∼10%rel) after 20 h of DH testing, mainly attributed to an increase in Rs on the front side of TOPCon cells, both sides of HJT cells and the rear side of PERC cells. The front of the PERC and the rear of the TOPCon solar cell are found to be stable. The rise in Rs is attributed to the corrosion of the metal contact, which is caused by a high amount of Na+ and Cl− ions penetrating the metal contact. This corrosion leads to increased porosity, detachment of the contact from the silicon interface, and increased recombination loss in some cases. These results are crucial for all cell technologies as they highlight the potential failures that could occur in the field. Na+ and/or Cl− ions are common contaminants present in solar glass, human fingerprints, soldering flux, rainwater, soil/dust, and seawater. During field operation, these ions have the potential to penetrate and directly interact with solar cells. In our view, the preferred solution is for the solar cells to be corrosion-resistant, which can be rapidly assessed using the method presented in this work.