Abstract
Pulsed power technology gives full play to the characteristics of high pulses in the form of short pulses, and gradually occupies a certain position in industrial applications. It needs to ensure stability and durability while ensuring that the working parameters are met, the switching performance is particularly important., therefore, the reliability study of IGBT power module becomes an inevitable requirement for reliability evaluation in engineering. This article mainly introduces the experimental method of the accelerated aging experiment of IGBT under pulsed power conditions. The electro-thermal simulation is carried out through PLECS and the low-power experimental platform is built to obtain experimental data. Finally, the experimental data is analyzed, and the change rule of the failure characteristic parameters with the aging process under the pulse power condition and the IGBT failure standard different from the typical operating condition are obtained.
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