Abstract
The temperature dependence of AC susceptibility of YBa 2Cu 3O 7− δ thin film was measured as a function of frequency and AC field amplitude in a field perpendicular to the film plane. We show that all measured AC susceptibility curves can be scaled into a single curve using the peak temperature ( T p) of its imaginary part as the scaling parameter. The frequency effect on AC susceptibility was also measured. As the frequency increases, ( T p) shifts to higher temperature. This effect can be interpreted in terms of flux creep. The temperature T, and field, H AC, dependence of the activation energy obtained from the Arrhenius plot for the frequency ( f) and ( T p), can be described as U( H AC, T)= U 0(1− T/ T c) H AC −0.18.
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