Abstract
A scanning near-field optical microscope (SNOM) with a nanometer-size aperture cantilever is a new powerful tool for investigating the optical characteristics of specimen surfaces. We applied the AC-mode feedback and gate pulse acquisition methods in illumination/reflection-mode SNOM. The application of the AC-mode feedback method increased the optical intensity of reflected light from two-to seven fold that obtained by the contact-mode feedback method. The use of the gate pulse acquisition method reduced optical imaging artifacts originating from the topographical features of surfaces.
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