Absorption and photoreflectance spectroscopy of zinc phthalocyanine (ZnPc) thin films grown by thermal evaporation

Abstract

Optical properties of the as-deposited and annealed ZnPc layers have been investigated using absorption, reflectance and modulated photoreflectance methods. The absorption coefficient of ZnPc layers was directly determined from the transmission and reflection spectra. The absorption spectra were analyzed in terms of the mixed Lorentz–Lorenz model. We found that annealing thin layers at 580 K caused a structural transformation, which results in the decrease of the absorption coefficient and the shifting of all peak position to lower energies except for the peak of the N-band. Photoreflectance spectroscopy confirmed that there exist three transitions in the Q-band region of the studied material. Complex refractive index and dielectric constants of the ZnPc layer were directly found from the spectral data.