Abstract
Infrared frequency synthesis techniques with metal-insulator-metal (MIM) diodes have been extended to include absolute frequency measurement of a spin-flip Raman laser (SFRL). As a result of this extension, spectroscopy in the 5.3 μm region more readily can be put on a frequency rather than a wavelength metrology basis. Additional observations with the diode are in qualitative agreement with recent wirk relating to non-linear tuning over axial SFRL modes.
Published Version
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