Absolute Präzisionsbestimmung von Gitterkonstanten an Germanium- und Aluminium-Einkristallen mit Elektroneninterferenzen

Abstract

An absolute precision determination of lattice constants by electron diffraction is made with thin monocrystalline films of germanium and aluminium, having a thickness between 1000 and 5000 A. The films are prepared from the bulk material by mechanical polishing and subsequent chemical polishing or etching. The obtained values for the lattice constant α of both materials are within the accuracy Δα/α= ±3·10-5 of measurement in full agreement with the corresponding values obtained by X-ray diffraction (Smakula and Kalnajs).