Abstract

This paper describes the use of the first and second optical return paths in a moderate-to-high finesse Fabry-Perot sensor to measure the absolute phase in extrinsic Fabry-Perot interferometry (EFPI) sensors. A path-matched differential interferometry (PMDI) using a highfinesse EFPI sensors, a low-finesse Fabry-Perot readout interferometer and a broadband light source consisting of amplified spontaneous emission (ASE) from an erbium-doped fiber amplifier (EDFA) is used to illustrate the idea. The first and second multiple paths in the Fabry-Perot readout sensor are used to provide two distinct path-match conditions from the same scanning Fabry-Perot readout interferometer. The difference in fringe numbers between the centers of two orders of interference fringe packets formed by the distinct path-match conditions makes possible a simple method of measuring the cavity length of EFPI sensors, which in turn can be used to measure absolute phase and the corresponding strain. Sensor cavity length measurement using the multiple return paths in the high-finesse Fabry-Perot sensor is correlated to that measurement using the modulation transfer function found using an optical spectrum analyzer; the multiple return path technique is then used to make strain measurements on a cantilever beam. Comparisons with resistance strain gage measurements are favorable. Characterization tests indicate that the proposed technique has a cavity length measurement resolution on the order of 1.1 μm, which translates to a strain resolution of 28 μe for a 4-cm gage length sensor.

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