Abstract
AbstractAn absolute method for the determination of the thickness of a nickel film on iron has been developed. The mass absorption coefficient of nickel for the effective wavelength has been determined empirically and mathematically. The found values were in agreement. To perform this method only one intensity measurement of the fluorescent substrate emission is required (Fe Kα). The method was tested using iron sheets with different thicknesses of nickel obtained by chemical deposition. Thicknesses between 6 and 25 μm produced relative differences from gravimetric values of 1.8‐1.1%.
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