Abstract
An improved theory for data reduction of absolute reflectance measurements using the third Taylor method in the alpha degrees / d configuration is presented. A brief description is given of an absolute reflectometer operating in the 0.8-2.5-microm region. The reflectometer is operated according to the improved theory. Experimental data for some widely used samples are given, as well as data showing agreement between the current measurements and those made by the U.S. National Institute of Standards and Technology.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
