Abstract
A method for obtaining the absolute lattice parameters of layered structures to an accuracy of a few units in 106 is described. A second motorized axis, for a reference crystal, is mounted onto a commercially available single-axis goniometer, so that double-crystal rocking curves can be combined with single-crystal lattice parameter measurements. The rocking curves and lattice parameter measurements are obtained from the same high-angle Bragg reflection, which results in this high degree of accuracy.
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